Designed for NDT, PCB inspection (BGA) and scientific research. System supplied with dynamic x-ray flat panel and microfocus source.
System copmplies with international regulations for fully shielded radiation devices.
Could be supplied with automatized manipulation system for detector and x-ray source.
- Sensitivity: class 1 on GOST 7512 and class В on ISO17636-2
- Pixel Pitch 50 µm
- Focal spot up to 100 um
- High speed data acquisition (up to 30 FPS)
- Wide dynamic range
- Magnification mode
- Inner dimensions 50х50х60sm (enlargement on request)
- Automatized movement of detector and x-ray source (on request)
- Grid (on request)
- Computer tomography module(on request)